HSMP-381Z, HSMP-386Z, HSMP-389Z PIN Diode Reliability Data Sheet Description at various temperatures as shown in Table 2. The wearout mechanisms are therefore not considered. The Arrhenius temperature de-rating equation is used. Avago Technologies assumes no failure mechanism change between stress and use conditions. Bias and temperature are alterable stresses and must be considered with the thermal resistance of the devices when determining the stress condition. The failure rate will have a direct relationship to the life stress. The process was tested to determine an activation energy of 1.2eV. Confidence intervals are based upon the chisquared prediction method associated with exponential distribution. The following data was gathered from the product qualification and reliability monitoring for HSMP-389Z. The reliability of HSMP-389Z can be cross referenced to HSMP-381Z and HSMP-386Z based on similarity in package assembly process. The product was subjected to severe environmental conditions and electrical stress to the minimum reliability expectations of today's RF requirement. Reliability Prediction Model An exponential cumulative failure function (constant failure rate) was used as the reliability prediction model to predict failure rate and mean time to failure (MTTF) Table 1. Life Tests Demonstrated Performance Test Name Stress Test Condition Total Units Tested Total Device Hours No. of Failed Units High Temperature Operating Life Tch = 150C DC Bias 180 180,000 0 The following are the failure criterions used, Id >20% RS and CT >20% Table 2. Estimates for various channel temperatures are as follows: Channel Temp. (C) [2] Point Typical Performance MTTF hours[1] 90% Confidence MTTF hours Point Typical Performance FIT 90% Confidence FIT 150 1.80 X 105 7.809 X 104 5555.6 12805.6 125 6 5 702.5 1619.2 6 67.3 155.2 7 14.1 32.5 100 85 1.42 X 10 7 1.49 X 10 7.10 X 10 7 6.176 X 10 6.444 X 10 3.080 X 10 [1] Point MTTF is simply the total device hours divided by the number of failures. However, in cases for which no failures are observed, the point estimate is calculated under the assumption that one unit failed. [2] Thermal Resistance: ch-b = 135oC/W Table 3. Product Qualification - Operational Life Test Results Stress Conditions Duration Failures/number tested High Temperature Operating Life (HTOL) Vf = 0.7V with channel temperature of 150 C. 1000 hours 0/180 Wet & High Temperature Reverse Bias (WHTRB) 85C/85% RH, Vr = 80%Vbr 1000 hours 0/180 Table 4. Product Qualification - Unbiased Environment Stress Results Stress Conditions Duration Failures/number tested Temperature Cycle -65C /150C, 10 minutes dwell 500 cycles 0/180 Low Temperature Storage Life -40C 1000hrs 0/177 Autoclave 121C/100%RH, 15psig 168hrs 0/180 Solderability 16hrs steam aging, solder dipping at 245C 5 sec 0/30 Table 5. Electrostatic Discharge (ESD) Test Results ESD Sensitivity HSMP-381Z The device is classified as ESD sensitive. The following precautions should be taken: ESD Test Reference: Results Human Body Model JESD22-A114-C 700V (Class 1B) Machine Model JESD22-A115-A 180V (Class A) 1. Ensure Faraday cage or conductive shield bag is used when the device is transported from one destination to another. 2. At SMT assembly station, if the static charge is above the device sensitivity level, place an ionizer near to the device for charge neutralization purpose. HSMP-386Z ESD Test Reference: Results Human Body Model JESD22-A114-C 700V (Class 1B) Machine Model JESD22-A115-A 180V (Class A) 3. Personal grounding has to be worn at all time when handling the device. Moisture Sensitivity Level: Level 1 Preconditioning per JESD22-A113-D Level 1 was performed on all devices prior to reliability testing. HSMP-389Z ESD Test Reference: Results Human Body Model JESD22-A114-C 450V (Class 1A) Machine Model JESD22-A115-A 160V (Class A) HBM Class 0 is ESD voltage level < 240V, Class 1A is voltage level between 250V and 500V, Class 1B is voltage level between 500V and 1000V, Class 1C is voltage level between 1000V and 2000V, Class 2 is voltage level between 2000V and 4000V, Class 3A is voltage level between 4000V and 8000V, Class 3B is voltage level > 8000V. MM Class A is ESD voltage level <200V, Class B is voltage level between 200V and 400V, Class C is voltage level > 400V. For product information and a complete list of distributors, please go to our web site: www.avagotech.com Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Pte. in the United States and other countries. Data subject to change. Copyright (c) 2006 Avago Technologies Pte. All rights reserved. AV01-0050EN - March 15, 2006