MMIC Digital Attenuator
DC-13GHz Die
ADH424S
ASD0016560 Rev. C
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1.0 SCOPE
This specification documents the detail requirements for space qualified die per MIL-PRF-38534 class K
except as modified herein.
The manufacturing flow described in the SPACE DIE BROCHURE is to be considered a part of this
specification.
This datasheet specifically details the space grade version of this product. A more detailed operational
description and a complete datasheet for commercial product grades can be found at
www.analog.com/HMC424
2.0 Part Number. The complete part number(s) of this specification follow:
Part Number Description
HMC8802 MMIC Digital Attenuator, DC-13GHz Die
3.0 Die Information
3.1 Die Dimensions
Die Size Die Thickness Bond Pad Metalization
33 mil x 57 mil 4 mil ± 0.5 mil Au
3.2 Die Picture
1. RF1 (DC coupled, matched to 50 ohms)*
2. VEE (Supply Voltage, -5V ±10%)
3. RF2 (DC coupled, matched to 50 ohms)*
4. V1
5. V2
6. V3
7. V4
8. V5
9. V6
Die bottom must be connected to RF GND
*Blocking capacitors are required if RF line
potential is not equal to 0V
ADH424S
ASD0016560 Rev. C | Page 2 of 4
Control Voltage Input Attenuation
State RF1 – RF2
V1
(16 dB)
V2
(8 dB)
V3
(4 dB)
V4
(2 dB)
V5
(1 dB)
V6
(0.5 dB)
Low Low Low Low Low Low Reference I.L.
Low Low Low Low Low High 0.5 dB
Low Low Low Low High Low 1 dB
Low Low Low High Low Low 2 dB
Low Low High Low Low Low 4 dB
Low High Low Low Low Low 8 dB
High Low Low Low Low Low 16 dB
High High High High High High 31.5 dB
Note: Any combination of the above states will provide an attenuation approximately equal to the sum of the bits selected
3.3 Absolute Maximum Ratings 1/
Control Voltage Range ........................................................ VEE - 0.5 VDC
Bias Voltage (VEE) ........................................................................ -7 VDC
Channel Temperature ....................................................................... 150C
RF Input Power (0.5 to 13 GHz) .................................................. +25 dBm
Thermal Resistance (Junction to Die Bottom) ............................. 330C /W
Ambient Operating Temperature Range (TA)..................... -40C to +85C
Storage Temperature ........................................................ -65C to +150C
Absolute Maximum Ratings Notes:
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum
levels may degrade performance and affect reliability.
4.0 Die
Qualification
In accordance with class-K version of MIL-PRF-38534, Appendix C, Table C-II, except as modified
Herein.
(a) Pre-screen test post assembly required prior to die qualification, to remove all assembly related
rejects.
(b) Mechanical Shock or Constant Acceleration not performed; die qualification is performed in an
open carrier.
(c) Interim and post burn-in electrical tests will include static tests screened at +25C only.
Table I - Dice Electrical Characteristics
Parameter Symbol
Conditions
1/, 2/, 3/, 4/
50 Ω System
Limit
Min
Limit
Max Units
Insertion Loss IL DC – 8.0 GHz
8 – 13.0 GHz
3.8
4.6 dB
Attenuation Range AR DC – 13.0 GHz 29.3 33.7 dB
Return Loss (RF1 & RF2 All Attenuation States) RL DC – 8.0 GHz
8 – 13.0 GHz
8
9 dB
Attenuation Accuracy: (Referenced to Insertion
Loss)
0.5 -7.5 dB States
8 – 31.5 dB States
Acc DC – 13.0 GHz
DC – 13.0 GHz
±0.3 +4% of Atten Setting Max
±0.3 + 6% of Atten Setting Max
dB
IEE IEE DC – 13 GHz 4 mA
Table I Notes:
1/ Limits apply at +25C only.
2/ Tested with VEE = -5V, V1-V6 Low = -3V, High = -4.2V
3/ S-par data to be tabulated at 250 MHz, 1 GHz, 3 GHz, 5 GHz, 9 GHz, 11 GHz, and 13 GHz. Pin = -25 dBm
4/ Measure major attenuation states only
ADH424S
ASD0016560 Rev. C | Page 3 of 4
Table II - Electrical Characteristics for Qual Samples
Parameter Symbol
Conditions 1/ 2/ 3/ 4/ 5/ 6/
-40°C ≤ TA ≤ 85°C unless
otherwise specified, 50
Ohm System
Sub-
groups
Min
Limit
Max
Limit Units
Insertion Loss IL DC – 8.0 GHz 4,5,6 3.8 dB
8.0 – 13.0 GHz 4,5,6 4.6
Attenuation Range AR DC – 13.0 GHz 4,5,6 29.3 33.7 dB
Return Loss (RF1 & RF2 All Attenuation States) RL DC – 8.0 GHz 4,5,6 8 dB
8.0 – 13.0 GHz 4,5,6 10
Attenuation Accuracy: (Referenced to Insertion
Loss)
0.5 - 7.5dB States
8 – 31.5 dB States
Acc
DC – 13 GHz
DC – 13 GHz 4,5,6
±0.3 + 4% of
Atten. Setting
Max dB
DC – 13 GHz
DC – 13 GHz 4,5,6
±0.3 + 6% of
Atten. Setting
Max
Input Power for 0.1dB Compression (REF State) IP0.1dB 1.0 – 13.0 GHz 4 22 dBm
5,6 17
Input Third Order Intercept Point (REF State)
Two-Tone Input Power = 0dBm each tone, 1MHz
tone separation
IIP3 1.0 – 13.0 GHz
4 38
dBm
5,6 34
IEE IEE DC – 13 GHz 4,5,6 5 mA
Table II Notes:
1/ Pre burn-in and Post burn-in electrical require S-parameter testing only as defined. Final electrical tests shall incorporate power tests as defined.
2/ Temperature testing required for Final Electrical testing only
3/ Tested with VEE = -5V, V1-V6 Low = -3V, High = -4.2V
4/ Measure major attenuation states only
5/ S-par data to be tabulated at 250 MHz, 1 GHz, 3 GHz, 5 GHz, 9 GHz, 11 GHz, and 13 GHz. Pin = -25 dBm
6/ P0.1dB and IP3 shall be tabulated at 1 GHz, 3 GHz, 5 GHz, 9 GHz, and 11 GHz
Table III - Endpoint and Delta Limits (+25°C)
(Product is tested in accordance with Table II with the following exceptions)
Parameter Sub-
groups
End-point Delta Units
Min Max
Insertion Loss 4 4.6 ±1.0 dB
IEE (Biased at -5V) 1 5 ±10 %
Table III Notes:
1/ Table II limits will not be exceeded
2/ 240 hour burn in and Group C end point electrical parameters. Deltas are performed at TA = 25°C
ADH424S
ASD0016560 Rev. C | Page 4 of 4
5.0 Die Outline
Rev Description of Change Date
A Initiate 26-October-2015
B Added Clarification to sections 3.2, 3.3 and 5.0. Adding IEE parameter to
Tables I and II. Remove symbol Column from Tables I, II and III 11-December-2015
C
Add note to clarify exception for temperatures for interim and post burn-in
electrical tests. Remove exception notes for maximum die qual temperature
and for sample size and qual acceptance criteria.
4-June-2019
1. RF1 (DC coupled, matched to 50 ohms)*
2. VEE (Supply Voltage, -5V ±10%)
3. RF2 (DC coupled, matched to 50 ohms)*
4. V1
5. V2
6. V3
7. V4
8. V5
9. V6
Die bottom must be connected to RF GND
*Blocking capacitors are required if RF line
potential is not equal to 0V
© 2019 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective companies.
Printed in the U.S.A. 6/19