REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Add vendor CAGE number 75569. Add device type 02. Add case outline S.
Technical changes in table I. Editorial changes throughout. 89-03-28 D. M. Cool
B
Update boilerplate to MIL-PRF-38535 requirement s. Editorial changes
throughout. – LTG
03-08-22
Thomas M. Hess
C
Add footnote 5/ for test condition of total power supply current (ICC) to table I.
Update boilerplate paragraphs to the current MIL-PRF-38535 requirements.
- LTG
10-01-14
Thomas M. Hess
D
Add footnote 7/ for total power supply current (ICC) in table I.
Update boilerplate paragraphs to the current MIL-PRF-38535 requirements.
- MAA
10-12-28
Thomas M. Hess
REV
SHEET
REV
SHEET
REV STATUS REV D D D D D D D D D D D D
OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12
PMIC N/A PREPARED BY
Monica L. Poelking
DLA LAND AND MARITIME
COLUMBUS, OHIO 4321 8-3990
http://www.dscc.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
Ray Monnin
APPROVED BY
D. M. Cool
MICROCIRCUIT, DIGITAL, FAST CMOS,
INVERTING OCTAL LINE DRIVER/BUFFER WITH
THREE-STATE OUTPUTS, TTL COMPATIBL E
INPUTS, MONOLITHIC SILICON
DRAWING APPROVAL DATE
87-11-03
AMSC N/A
REVISION LEVEL
D SIZE
A CAGE CODE
67268
5962-87655
SHEET 1 OF 12
DSCC FORM 2233
APR 97 5962-E140-11
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-87655 01 R A
Drawing number Device type
(see 1.2.1) Case outline
(see 1.2.2) Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function
01 54FCT240 Inverting octal line driver/buffer with
three-state, TTL compatible inputs
02 54FCT240A Inverting octal line driver/buffer with
three-state, TTL compatible inputs
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 a nd as follows:
Outline letter Descriptive designator Terminals Package style
R GDIP1-T20 or CDIP2-T20 20 Dual-in-line
S GDFP2-F20 or CDFP3-F20 20 Flat pack
2 CQCC1-N20 20 Square leadless chip carrier
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absolute maximum ratings. 1/
Supply voltage range ........................................................... -0.5 V dc to +6.0 V dc
Input voltage range .............................................................. -0.5 V dc to VCC + 0.5 V dc
Output voltage range ............................................................ -0.5 V dc to VCC + 0.5 V dc
DC input diode current (IIK) ................................................... -20 mA
DC output diode current (IOK) ............................................... -50 mA
DC output current ................................................................. 100 mA
Maximum power dissipation (PD) 2/ .................................... 500 mW
Thermal resistance, junction-to-case (JC) ........................... See MIL-STD-1835
Storage temperature range .................................................. -65C to +150C
Junction temperature (TJ) ..................................................... +175C
Lead temperature (soldering, 10 seconds) ........................... +300C
1.4 Recommended operating conditions.
Supply voltage range (VCC) .................................................. +4.5 V dc to +5.5 V dc
Maximum low level input voltage (VIL) .................................. 0.8 V dc
Minimum hig h l evel input voltage (VIH) ................................. 2.0 V dc
Case operating temperature range (TC) ............................... -55C to +125C
1/ All voltages are referenced to GND.
2/ Must withstand the added PD due to short circuit test; e.g., IOS.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENT S
2.1 Government specification, standards, and han dbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-385 35 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standar d Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents ar e available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue , Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations un less a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item r equirements shall be in accor dance with MIL-PRF-38535, a ppendix A for non-
JAN class level B devices and as specified h erein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified man ufacturer or a manufacturer who has been granted transitional certification to
MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and
qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Managem ent
(QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the
device. These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordanc e with
MIL-PRF-38535 is required to identify when the QML flow option is used.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535, appendix A and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.
3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4.
3.3 Electrical performance characteristics . Unless otherwise specified h erein, the electrical performance characteristics are
as specified in table I and shall app ly over the full (case or ambient) operating temper ature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. T he electrical
tests for each subgroup are described in tabl e I.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 4
DSCC FORM 2234
APR 97
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appe ndix A. The part shall be marked with the PIN
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD
PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replac ed with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as require d in MIL-PRF-38535, appendix A shall be provided
with each lot of microcircuits deliver ed to this drawing.
3.8 Notification of change. Notification of change to DLA Land and Maritime-VA shall be required for any change that
affects this drawing.
3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime's agent, and the acquiring activity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the optio n of the reviewer.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristi c s.
Test Symbol Test conditions
-55C TC +125C
VCC = 5.0 V dc 10%
unless otherwise specified
Device
type Group A
subgroups Limits Unit
Min Max
High level output
voltage VOH V
CC = 4.5 V
VIL = 0.8 V
VIH = 2.0 V
IOH = -300 A All 1, 2, 3 4.3 V
IOH = -12 mA All 1, 2, 3 2.4
Low level output
voltage VOL V
CC = 4.5 V
VIL = 0.8 V
VIH = 2.0 V
IOL = +300 A All 1, 2, 3 0.2 V
IOL = +32 mA All 1, 2, 3 0.5
Input clamp voltage VIK V
CC = 4.5 V, IIN = -18 mA All 1 -1.2 V
High level input
current IIH V
CC = 5.5 V, VIN = 5.5 V All 1, 2, 3 5.0 A
Low level input
current IIL V
CC = 5.5 V, VIN = GND All 1, 2, 3 -5.0 A
High impedance
output current IOZH V
CC = 5.5 V, VIN = 5.5 V All 1, 2, 3 10 A
IOZL V
CC = 5.5 V, VIN = GND All 1, 2, 3 -10
Short circuit output
current IOS V
CC = 5.5 V 1/ All 1, 2, 3 -60 mA
Quiescent power
supply current
(CMOS inputs)
ICCQ VIN 0.2 V or VIN 5.3 V
VCC = 5.5 V
fi = 0 MHz
All 1, 2, 3 1.5 mA
Quiescent power
supply current
(TTL inputs)
ICC VCC = 5.5 V
VIN = 3.4 V 2/ All 1, 2, 3 2.0 mA
Dynamic power
supply current ICCD V
CC = 5.5 V
OE = GND
VIN 5.3 V or VIN 0.2 V
One bit toggling
50% duty cycle
Output open
All 3/ 0.25 mA/
MHz
Total power supply
current
4/ 5/ 7/
ICC V
CC = 5.5 V
Outputs open
OE = GND
One bit toggling
50% duty cycle
fi = 10 MHz
VIN 5.3 V
or
VIN 0.2 V
All 1, 2, 3 4.0 mA
VIN 3.4 V
or
VIN = GND
All 1, 2, 3 4.8 mA
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristi c s – Continue d.
Test Symbol Test conditions
-55C TC +125C
VCC = 5.0 V dc 10%
unless otherwise specified
Device
type Group A
subgroups Limits Unit
Min Max
Input capacitance CIN See 4.3.1c All 4 10 pF
Output capacitance COUT See 4.3.1c All 4 12 pF
Functional tests See 4.3.1d All 7, 8
Propagation delay time,
Dn to On tPLH,
tPHL CL = 50 pF 10%
RL = 500 5%
See figure 4 6/
01 9, 10, 11 1.5 9.0 ns
02 9, 10, 11 1.5 5.1
Output enable time,
OEn to On tPZH,
tPZL 01 9, 10, 11 1.5 10.5 ns
02 9, 10, 11 1.5 6.5
Output disable time,
OEn to On tPHZ,
tPLZ 01 9, 10, 11 1.5 12.5 ns
02 9, 10, 11 1.5 5.9
1/ Not more than one output should be shorted at one time, and the duration of the short circuit condition should not exceed
one second.
2/ TTL driven input (VIN = 3.4 V); all other inputs at VCC or GND.
3/ This parameter is not directly testable, but is derived for use in total power supply calculations.
4/ ICC = ICCQ + (ICC x DH x NT) + (ICCD x fI x NI)
Where: DH = Duty cycle for TTL inputs high.
NT = Number of TTL inputs at DH.
fI = Input frequency in MHz.
NI = Number of inputs at fI.
5/ For ICC test in an ATE environment, the effect of parasitic output capacitive loading from the test environment must be taken
into account, as its effect is not intended to be included in the test results. The impact must be characterized and appropriate
offset factors must be applied to the test result.
6/ The minimum limits are guaranteed, if not tested, to the specified limits.
7/ The Supplier/ Vendor (cage code 0C7V 7 ) devices meet total power supply current limit, Icc = 5.5 mA at VIN 5.3 V or
VIN 0.2 V, and Icc = 6.0 mA at VIN 3.4 V or VIN = GND; although table I stated Icc = 4.0 mA and 4.8 mA.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 7
DSCC FORM 2234
APR 97
Device types 01 and 02
Case outlines R, S, and 2
Terminal number Terminal symbol
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
OEA
DA0
OB0
DA1
OB1
DA2
OB2
DA3
OB3
GND
DB3
OA3
DB2
OA2
DB1
OA1
DB0
OA0
OEB
VCC
FIGURE 1. Terminal connections.
Device types 01 and 02
Inputs Output
OEA, OEB DAn, DBn OAn, OBn
L L H
L H L
H X Z
L = Low voltage level
H = High voltage level
X = Irrelevant
Z = High impedance state
FIGURE 2. Truth table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 8
DSCC FORM 2234
APR 97
FIGURE 3. Logic diagram.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 9
DSCC FORM 2234
APR 97
NOTES:
1. Diagram shown for input control enable – low and input control disable – high.
2. Pulse generator for all pulses: tf 2.5 ns, tr 2.5 ns.
FIGURE 4. Switching waveforms and test circuit.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 10
DSCC FORM 2234
APR 97
Switch position
Test
Switch
tPLZ
tPZL
All other
Closed
Closed
Open
NOTES:
1. RL = 500.
2. CL = 50 pF; load capacitance includes jig and probe capacitance.
3. RT = Termination resistance should be equal to ZOUT of pulse generators.
FIGURE 4. Switching waveforms and test circuit – Continued.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 11
DSCC FORM 2234
APR 97
4. VERIFICATION
4.1 Sampling and inspection. Samplin g and inspection pro cedures shall be in accorda nce with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim el ectrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004) ---
Final electrical test parameters
(method 5004) 1*, 2, 3, 7, 8, 9, 10, 11
Group A test requirements
(method 5005) 1, 2, 3, 4, 7, 8, 9, 10, 11
Groups C and D end-point
electrical parameters
(method 5005)
1, 2, 3, 7, 9
* PDA applies to subgroup 1.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accorda nce with method 5005 of
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (CIN measurement) shall be measured only for the initial test and after process or design changes which
may affect input capacitance. Test all applicable p ins o n five devices with zero failures.
d. Subgroups 7 and 8 shall inclu de verification of the truth tabl e as spec ified on figure 2 herein.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87655
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 12
DSCC FORM 2234
APR 97
4.3.2 Groups C and D inspe c tions .
a. End-point electrical p arameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be ma de available to the preparing or acquiring activit y upon requ est. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(2) TA = +125C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
5. PACKAGING
5.1 Packaging requirements. The requir ements for packaging shall be in accordance with MIL-PRF-38535, appendi x A.
6. NOTES
6.1 Intended use. Microcircuits conforming t o this drawing are intended for use for Government microcircuit applicati on s
(original equipment), desig n applications, and lo gistics purposes.
6.2 Replaceability. Microcirc uits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed chan ges to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.4 Record of users. Military and industrial users should inform DLA Land and Maritime, when a system applicatio n requires
configuration control and the applicable SMD. DLA Land and Maritime will maintain a re cord of users and this list will be used
for coordination and distribution of cha nges to the drawings. Users of drawings covering microelectronics devices
(FSC 5962) should contact DLA Land an d Maritime -VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-
3990, or telephone (614) 692-0547.
6.6 Approved sources of supply. Approved sources of suppl y are listed in MIL-HDBK-103. The vendors listed in
MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and
accepted by DLA Land and Maritime -VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 10-12-28
Approved sources of suppl y for SMD 5962-87655 are listed belo w for immediate acquisition information only and
shall be added to MIL-HDBK-103 an d QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed bel ow have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information
bulletin is superseded by the ne xt dated revision of MIL-HDBK-103 and QML-38 535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8765501RA 0C7V7 54FCT240DMQB
5962-8765501SA 0C7V7 54FCT240FMQB
5962-87655012A 0C7V7 54FCT240LMQB
5962-8765502RA 3/ IDT54FCT240ADB
5962-8765502SA 3/ IDT54FCT240AEB
5962-87655022A 3/ IDT54FCT240ALB
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number m ay not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE Vendor name
number and address
0C7V7 QP Semiconductor
2945 Oakmead Village Court
Santa Clara, CA 95051
The information contained herein is disseminated for conv enience only and the
Government assumes no liability whatsoeve r for any inaccuracies in the
information bulletin.
