IRF540
2Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 0.25 mAdc)
Temperature Coefficient (Positive)
V(BR)DSS 100
——
116 —
—
Vdc
mV/°C
Zero Gate Voltage Drain Current
(VDS = 100 Vdc, VGS = 0 Vdc)
(VDS = 100 Vdc, VGS = 0 Vdc, TJ = 125°C)
IDSS —
——
—10
100
m
Adc
Gate–Body Leakage Current
(VGS = ±20 Vdc, VDS = 0 Vdc) IGSS — — 100 nAdc
ON CHARACTERISTICS(1)
Gate Threshold Voltage Cpk ≥ 2.0(3)
(VDS = VGS, ID = 250 µAdc)
Threshold Temperature Coefficient (Negative)
VGS(th) 2.0
—2.9
6.8 4.0
—
Vdc
mV/°C
Static Drain–to–Source On–Resistance Cpk ≥ 2.0(3)
(VGS = 10 Vdc, ID = 15 Adc) RDS(on) —0.047 0.070 Ohms
Drain–to–Source On–V oltage
(VGS = 10 Vdc, ID = 27 Adc)
(VGS = 10 Vdc, ID = 15 Adc, TJ = 125°C)
VDS(on) —
——
—1.9
1.8
Vdc
Forward T ransconductance (VDS = 15 Vdc, ID = 15 Adc) gFS 6.0 15 — Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
Ciss —1460 1600 pF
Output Capacitance (VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz
Coss —390 800
T ransfer Capacitance
.
Crss —120 300
SWITCHING CHARACTERISTICS(2)
T urn–On Delay Time
td(on) —11.6 30 ns
Rise T ime (VDD = 30 Vdc, ID = 15 Adc, tr— 50 60
T urn–Off Delay Time
VGS = 10 Vdc, RG = 4.7 Ω)td(off) —26 80
Fall T ime tf— 19 30
Gate Charge
QT— 50 60 nC
(See Figure 8) (VDS = 80 Vdc, ID = 27 Adc, Q1— 9.0 —
VGS = 10 Vdc) Q2—26 —
Q3— 20 —
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage
(IS = 27 Adc, VGS = 0 Vdc)
(IS = 27 Adc, VGS = 0 Vdc, TJ = 125°C)
VSD —
—0.93
0.84 2.4
—
Vdc
Reverse Recovery Time
trr —110 — ns
(IS = 27 Adc, VGS = 0 Vdc, ta—100 —
dIS/dt = 100 A/µs) tb— 10 —
Reverse Recovery Stored Charge QRR —0.67 —
m
C
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from the contact screw on tab to center of die)
(Measured from the drain lead 0.25″ from package to center of die)
Ld—
—3.5
4.5 —
—
nH
Internal Source Inductance
(Measured from the source lead 0.25″ from package to source bond pad) Ls— 7.5 —
(1) Pulse Test: Pulse Width ≤300 µs, Duty Cycle ≤ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) Reflects typical values. Cpk
+Ť
Max limit – Typ
3
sigma
Ť